Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution
M. M. Bagher, C. Soler, N. Holzschuch
In Computer Graphics Forum, 31(4), 2012.
Abstract: Material models are essential to the production of photo-realistic images. Measured BRDFs provide accurate representation with complex visual appearance, but have larger storage cost. Analytical BRDFs such as Cook-Torrance provide a compact representation but fail to represent the effects we observe with measured appearance. Accurately fitting an analytical BRDF to measured data remains a challenging problem. In this paper we introduce the SGD micro-facet distribution for Cook-Torrance BRDF. This distribution accurately models the behavior of most materials. As a consequence, we accurately represent all measured BRDFs using a single lobe. Our fitting procedure is stable and robust, and does not require manual tweaking of the parameters.
Article URL: http://dx.doi.org/10.1111/j.1467-8659.2012.03147.x
BibTeX format:
@article{Bagher:2012:AFO,
  author = {M. M. Bagher and C. Soler and N. Holzschuch},
  title = {Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution},
  journal = {Computer Graphics Forum},
  volume = {31},
  number = {4},
  pages = {1509--1518},
  year = {2012},
}
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