Microgeometry capture using an elastomeric sensor
Micah K. Johnson, Forrester Cole, Alvin Raj, Edward H. Adelson
In ACM Transactions on Graphics, 30(4), July 2011.
Abstract: We describe a system for capturing microscopic surface geometry. The system extends the retrographic sensor [Johnson and Adelson 2009] to the microscopic domain, demonstrating spatial resolution as small as 2 microns. In contrast to existing microgeometry capture techniques, the system is not affected by the optical characteristics of the surface being measured---it captures the same geometry whether the object is matte, glossy, or transparent. In addition, the hardware design allows for a variety of form factors, including a hand-held device that can be used to capture high-resolution surface geometry in the field. We achieve these results with a combination of improved sensor materials, illumination design, and reconstruction algorithm, as compared to the original sensor of Johnson and Adelson [2009].
Keyword(s): geometry, material, microstructure, texture
@article{Johnson:2011:MCU,
author = {Micah K. Johnson and Forrester Cole and Alvin Raj and Edward H. Adelson},
title = {Microgeometry capture using an elastomeric sensor},
journal = {ACM Transactions on Graphics},
volume = {30},
number = {4},
pages = {46:1--46:8},
month = jul,
year = {2011},
}
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