Signal-Specialized Parameterization for Piecewise Linear Reconstruction
Geetika Tewari, John Snyder, Pedro V. Sander, Steven J. Gortler, Hugues Hoppe
SGP04: Eurographics Symposium on Geometry Processing, 2004, pp. 57--66.
Abstract: We propose a metric for surface parameterization specialized to its signal that can be used to create more efficient, high-quality texture maps. Derived from Taylor expansion of signal error, our metric predicts the signal approximation error - the difference between the original surface signal and its reconstruction from the sampled texture. Unlike previous methods, our metric assumes piecewise-linear reconstruction, and thus makes a good approximation to bilinear reconstruction employed in graphics hardware. We achieve significant savings in texture area for a desired signal accuracy compared to the signal-specialized parameterization metric proposed by Sander et al. in the 2002 Eurographics Workshop on Rendering.
Article URL: http://dx.doi.org/10.2312/SGP/SGP04/057-066
BibTeX format:
@inproceedings{Tewari:2004:SPF,
  author = {Geetika Tewari and John Snyder and Pedro V. Sander and Steven J. Gortler and Hugues Hoppe},
  title = {Signal-Specialized Parameterization for Piecewise Linear Reconstruction},
  booktitle = {SGP04: Eurographics Symposium on Geometry Processing},
  pages = {57--66},
  year = {2004},
}
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