Segmenting point-sampled surfaces
Ichitaro Yamazaki, Vijay Natarajan, Zhaojun Bai, Bernd Hamann
In The Visual Computer, 26(12), December 2010.
Abstract: Extracting features from point-based representations of geometric surface models is becoming increasingly important for purposes such as model classification, matching, and exploration. In an earlier paper, we proposed a multiphase segmentation process to identify elongated features in point-sampled surface models without the explicit construction of a mesh or other surface representation. The preliminary results demonstrated the strength and potential of the segmentation process, but the resulting segmentations were still of low quality, and the segmentation process could be slow. In this paper, we describe several algorithmic improvements to overcome the shortcomings of the segmentation process. To demonstrate the improved quality of the segmentation and the superior time efficiency of the new segmentation process, we present segmentation results obtained for various point-sampled surface models. We also discuss an application of our segmentation process to extract ridge-separated features in point-sampled surfaces of CAD models.
Keyword(s): Point sets, Sampling, Features, Geodesic distance, Normalized cut, Topological methods, Spectral analysis, Multiphase segmentation, Hierarchical segmentation
BibTeX format:
@article{Yamazaki:2010:SPS,
  author = {Ichitaro Yamazaki and Vijay Natarajan and Zhaojun Bai and Bernd Hamann},
  title = {Segmenting point-sampled surfaces},
  journal = {The Visual Computer},
  volume = {26},
  number = {12},
  pages = {1421--1433},
  month = dec,
  year = {2010},
}
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